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Wafer measuring equipment

Alignment measurement of overlay in semiconductor production

High sensitivity、Process adaptability、Superior CoO、User-friendly、Factory automation

CharacteristicScene

High sensitivity:high performance imaging system with high NA and low aberration are adopted.

Process adaptability:Wide spectrum light source and polarization can be added, which has good process adaptability for FinFET process.

Superior CoO:Ultra-precision high-speed motion platformare coupledwith high performance measurement method.

User-friendly: Automatic measurement mode selection and automatic prescription generation are available, so that prescription generation time ca n greatly saved.

Factory automation: It supportsSECS/GEM SEMI standard, which can fully meet the requirements of factory automation.

    WeChat official account

      • Address 1:Building 1,No.469 Huatuo Lane,High Tech Zone,
        Hefei,Anhui Province,China(230094)
        Address 2:Building 5,No.661 Rongqiao Rd,Pudong New Area,
        Shanghai,China(201206)
        Tel 1:+86-0551-65116087
        Tel 2:+86-021-50935077
        Email: yuweitek@yuweitk.com